Correction of Line Interference in X-Ray Fluorescence Trace Analysis. Application to Yttrium Determination in Silicate Rocks

1997 ◽  
Vol 26 (5) ◽  
pp. 272-274 ◽  
Author(s):  
José Antonio Gásquez ◽  
Ernesto Perino ◽  
Eduardo Marchevsky ◽  
Roberto Olsina ◽  
Alberto Riveros
Keyword(s):  
Trace Analysis ◽  
X Ray ◽  
Analysis Application ◽  
Silicate Rocks ◽  
Line Interference

Development and validation of a WD‐XRF method for quantitative trace analysis: Application in the food industry

2020 ◽  
Author(s):  
María Fernanda Gazulla ◽  
Marta Rodrigo ◽  
María Jesús Ventura ◽  
Mónica Orduña ◽  
Cristina Andreu
Keyword(s):  
Trace Analysis ◽  
Food Industry ◽  
Analysis Application ◽  
Development And Validation

Use of Primary Filters in X-Ray Spectrography: A New Method for Trace Analysis

1968 ◽  
pp. 105-113 ◽  
Author(s):  
S. Caticha-Ellis ◽  
Ariel Ramos ◽  
Luis Saravia
Keyword(s):  
Trace Analysis ◽  
New Method ◽  
X Ray

Trace Analysis of Al on Silicon Surfaces by Ultra‐soft X‐Ray Emission Spectroscopy

2003 ◽  
Vol 36 (1-2) ◽  
pp. 93-98
Author(s):  
G. Andermann ◽  
T. Scimeca ◽  
C. H. Zhang
Keyword(s):  
Trace Analysis ◽  
Emission Spectroscopy ◽  
Silicon Surfaces ◽  
X Ray

Multielemental trace analysis by proton induced X-ray fluorescence

1984 ◽  
Vol 34 (12) ◽  
pp. 1315-1323 ◽  
Author(s):  
V. Hnatowicz ◽  
J. Kvítek ◽  
R. Džmuráň ◽  
F. Nový ◽  
I. Obrusník ◽  
...  
Keyword(s):  
Trace Analysis ◽  
X Ray

Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis

1972 ◽  
pp. 373-387 ◽  
Author(s):  
T. B. Johansson ◽  
R. Akselsson ◽  
S. A. E. Johansson
Keyword(s):  
Trace Analysis ◽  
Emission Spectroscopy ◽  
X Ray

scholarly journals In Situ Synchrotron X-ray Analysis: Application of High-Pressure Sliding Process to Ti Allotropic Transformation

2020 ◽  
Author(s):  
Zenji Horita ◽  
Daisuke Maruno ◽  
Yukimasa Ikeda ◽  
Takahiro Masuda ◽  
Yongpeng Tang ◽  
...  
Keyword(s):  
High Pressure ◽  
Allotropic Transformation ◽  
X Ray ◽  
Analysis Application
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